Measurement of surface temperature and emissivity by a multitemperature method for Fourier-transform infrared spectrometers

Applied Optics

Volumn 35, Issue 28, 1996, Pages 5683-5691

  Clausen, Sønnik ^a   Morgenstjerne, Axel ^a   Rathmann, Ole ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

Blackbody; Calibration; Emissivity; Fourier transform infrared; Infrared emission spectroscopy; Surface temperature

Indexed keywords

ALGORITHMS; BRASS; COMPUTER SIMULATION; EMISSION SPECTROSCOPY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INFRARED SPECTROMETERS; LEAST SQUARES APPROXIMATIONS; MEASUREMENT ERRORS; NICKEL; SURFACES;

BLACKBODY SOURCE; LEAST SQUARES FITTING METHOD; MULTITEMPERATURE METHOD; PLANCK RADIATION LAW; SPECTRAL EMISSIVITY; SURFACE TEMPERATURE;

TEMPERATURE MEASUREMENT;

EID: 0030270110     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.35.005683     Document Type: Article

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