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Volumn 366, Issue 1, 1996, Pages 85-92
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Scanning tunneling microscopy studies of niobium carbide (100) and (110) surfaces
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Author keywords
Carbides; Low index single crystal surfaces; Scanning tunneling microscopy; Surface structure, morphology, roughness, and topography
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Indexed keywords
ANNEALING;
CLEANING;
MORPHOLOGY;
PHASE COMPOSITION;
SCANNING TUNNELING MICROSCOPY;
SINGLE CRYSTALS;
SPUTTERING;
SURFACE ROUGHNESS;
SURFACE STRUCTURE;
SURFACES;
ATOM RESOLVED STRUCTURES;
GRATING STRUCTURE;
IN SITU CLEANING TREATMENT;
NANOMETER SCALE FACETING PHENOMENON;
NIOBIUM CARBIDE;
TOPOGRAPHY;
CARBIDES;
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EID: 0030270084
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/0039-6028(96)00804-7 Document Type: Article |
Times cited : (18)
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References (26)
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