Composition, surface topography, structure, Raman, and electrochemical/photoelectrochemical characterisation of CdxHg1-xTe films

Solar Energy Materials and Solar Cells

Volumn 43, Issue 3, 1996, Pages 223-235

  Sahu, S N ^a   Antonio, M J ^b   Sanchez, C ^b  

^a INSTITUTE OF PHYSICS   (India)

^b UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

Author keywords

CdxHg1 xTe; Raman; SEM; Semiconductor; Solar cells; Spectral response; Thin films; XRD

Indexed keywords

ANNEALING; COMPOSITION EFFECTS; ELECTROCHEMISTRY; ELECTRODEPOSITION; ENERGY GAP; PHOTOELECTROCHEMICAL CELLS; RAMAN SCATTERING; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING CADMIUM COMPOUNDS; SOLAR CELLS; SURFACE STRUCTURE; X RAY DIFFRACTION ANALYSIS;

OPEN CIRCUIT PHOTOVOLTAGE; SHORT CIRCUIT PHOTOCURRENT;

SEMICONDUCTING FILMS;

EID: 0030269833     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/0927-0248(95)00173-5     Document Type: Article

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