Equipment for in-situ X-ray diffraction and resistance measurements during ion implantation at temperatures between 4 and 1270 K

Surface and Coatings Technology

Volumn 84, Issue 1-3, 1996, Pages 563-566

  Koniger A ^a   Zander, W ^b   Wenzel, A ^a   Stritzker, B ^a   Rauschenbach, B ^a  

^a UNIVERSITY OF AUGSBURG   (Germany)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

Four point resistance; In situ XRD; Ion implantation

Indexed keywords

CRYOSTATS; ELECTRIC RESISTANCE MEASUREMENT; IRON COMPOUNDS; SUPERFLUID HELIUM; THERMAL EFFECTS; VACUUM; X RAY DIFFRACTION;

FOUR POINT RESISTANCE; GUINIER GEOMETRY; IN SITU X RAY DIFFRACTION; ION FLUENCE; ION IMPLANTER; PHASE FORMATION;

ION IMPLANTATION;

EID: 0030269733     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(95)02743-2     Document Type: Article

References (9)

1. D.M. Follstaedt, Nucl. Instrum. Meth. B, 7/8 (1985) 11.
2. B. Rauschenbach, Nucl. Instrum. Meth. B, 80/81 (1993) 303.
3. C. Landsberger, H. Metzger, J. Peisl, S. Rugel and G. Wallner, Surf. Coat. Technol., 45 (1991) 221.
4. N. Karpe, Nucl. Instrum. Meth. B, 95 (1995) 485.
5. T. Lyman (ed.), Metals Handbook, Vol. 8, ASM Metals Park, OH, 1973, p. 275.
6. C. Jaouen, J. Delafond and J.P. Rivière, J. Phys. F, 17 (1987) 335.
7. B. Rauschenbach, Nucl. Instrum. Meth. B, 18 (1986) 34.
8. A. Vredenberg, Thesis, Utrecht 1990.
9. J.W. Christian, The Theory of Transformations in Metals and Alloys, Pergamon Press, Oxford, 1975.