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Volumn 198, Issue 1-2, 1996, Pages 39-45

Condition monitoring of the grinding process using light scattering

Author keywords

Condition monitoring; Grinding; Light scattering; Surface finish

Indexed keywords

GRINDING (MACHINING); GRINDING WHEELS; LIGHT SCATTERING; RELIABILITY; ROUGHNESS MEASUREMENT; SERVICE LIFE; SURFACE ROUGHNESS; SURFACE TREATMENT;

EID: 0030267974     PISSN: 00431648     EISSN: None     Source Type: Journal    
DOI: 10.1016/0043-1648(95)06906-2     Document Type: Article
Times cited : (4)

References (7)
  • 2
    • 0019675089 scopus 로고
    • Light scattering from manufactured surfaces
    • E.C. Teague, T.V. Vorburger and D. Maystre, Light scattering from manufactured surfaces, Ann. CIRP, 30 (1981) 563.
    • (1981) Ann. CIRP , vol.30 , pp. 563
    • Teague, E.C.1    Vorburger, T.V.2    Maystre, D.3
  • 3
    • 0141725321 scopus 로고
    • Direct and inverse problems for light scattering by rough surfaces
    • E. Marx and T.V. Vorburger, Direct and inverse problems for light scattering by rough surfaces, Appl. Optics, 29 (1990) 3616-3626.
    • (1990) Appl. Optics , vol.29 , pp. 3616-3626
    • Marx, E.1    Vorburger, T.V.2
  • 4
    • 0019552551 scopus 로고
    • Optical techniques for on-line measurement of surface topography
    • T.V. Vorburger and E.C. Teague, Optical techniques for on-line measurement of surface topography, Precision Eng., 3 (1981) 61-83.
    • (1981) Precision Eng. , vol.3 , pp. 61-83
    • Vorburger, T.V.1    Teague, E.C.2
  • 5
    • 0024061901 scopus 로고
    • Modern measurement techniques in surface metrology: Part 2, optical instruments
    • I. Sherrington and E.H. Smith, Modern measurement techniques in surface metrology: Part 2, Optical instruments, Wear, 125 (1988) 289-308.
    • (1988) Wear , vol.125 , pp. 289-308
    • Sherrington, I.1    Smith, E.H.2
  • 6
    • 0026974554 scopus 로고
    • Recent developments in surface roughness characterisation
    • J.M. Bennett, Recent developments in surface roughness characterisation, Measurement Sci. Technol., 3 (1992) 119-127.
    • (1992) Measurement Sci. Technol. , vol.3 , pp. 119-127
    • Bennett, J.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.