Applications of FT-IR microscopy with materials analyses

Micron

Volumn 27, Issue 5, 1996, Pages 341-344

  Wilhelm, Peter ^a  

^a Zentrum fur Elektronenmikroskopie G   (Austria)

Author keywords

attenuated total reflectance; FT IR microscopy; Infrared spectroscopy; materials analyses; polymers; rubber

Indexed keywords

EID: 0030265346     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(96)00020-0     Document Type: Article

References (4)

1. Harrick, N. J., 1967. Internal Reflection Spectroscopy. John Wiley, New York.
2. Humecki, H. J. (ed.), 1995. Practical Guide to Infrared Microspectroscopy. Practical Spectroscopy Series Vol. 19. Marcel Dekker, New York.
3. Messerschmidt, R. G. and Harthcock, M. A. (eds), 1988. Infrared Microspectroscopy: Theory and Applications. Marcel Dekker, New York.
4. Reffner, J. A., Wihlborg, W. T. and Strand, S. W., 1991. Chemical Microscopy of Surfaces by Grazing Angle and Internal Reflection FTIR Microscopy. Am. Lab., 23, 46-48.