Magnetic properties of synthetic milled and annealed titanomagnetite (Fe2.3Ti0.7O4) particles 1-125 μm in diameter and analysis of their microcrystalline structure

Geophysical Research Letters

Volumn 23, Issue 20, 1996, Pages 2855-2858

  Zitzelsberger, A ^a   Schmidbauer, E ^a  

^a UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLITE SIZE; ETCHING; HYSTERESIS; MAGNETISM; MILLING (MACHINING); SATURATION MAGNETIZATION; ANNEALING; COMMINUTION; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; MAGNETIC HYSTERESIS; MAGNETIC PROPERTIES; MAGNETIZATION; MAGNETOSTRICTION; PARTICLE SIZE ANALYSIS; PARTICLES (PARTICULATE MATTER); RECRYSTALLIZATION (METALLURGY); X RAY ANALYSIS;

ANISOTROPIC STRAIN; CRYSTALLOGRAPHIC METHODS; DISLOCATION DENSITIES; HYSTERESIS PROPERTIES; MAGNETIC PARAMETERS; MICROCRYSTALLINE STRUCTURES; REMANENT MAGNETIZATION; X-RAY LINE BROADENING;

ANNEALING; MAGNETITE;

DISLOCATION DENSITY; GRAIN SIZE FRACTIONS; MICROCRYSTALLINE STRUCTURE; TITANOMAGNETITE; X RAY LINE BROADENING;

ANNEALING; HYSTERESIS; MAGNETIC PROPERTIES; MILLING; TITANOMAGNETITE;

EID: 0030265332     PISSN: 00948276     EISSN: None     Source Type: Journal    
DOI: 10.1029/96GL02830     Document Type: Article

References (10)

1. Balzar, D., Profile filling of X-ray diffraction lines and Fourier analysis of broadening, J. Appl. Cryst. 25, 559-570, 1992.
2. Balzar, D., private communication, 1995.
3. Benedetti, A., G. Fagherazzi, S. Enzo, and M. Battagliarin, A profile-fitting procedure for analysis of broadened X-ray diffraction peaks. II. Application and discussion of the methodology, J. Appl. Cryst. 21, 543-549, 1988.
4. Day, R., M. Fuller, and V.A. Schmidt, Hysteresis properties of titanomagnetites: grain-size and compositional dependence, Phys. Earth Planet. Inter. 13, 260-267, 1977.
5. De Keijser, Th.H., Langford, J.I., Mittemeijer, E.J., and A.B.P. Vogels, Use of the Voigt function in a single line method for the analysis of X-ray diffraction line broadening, J. Appl. Cryst. 15, 308-314, 1982.
6. Enzo, S., G. Fagherazzi, A. Benedetti, and S. Pollizi, A profile procedure for analysis of broadened X-ray diffraction peaks. I. Methodology, J. Appl. Cryst. 21, 536-542, 1988.
7. Williamson, G.K., and W.H. Hall, X-ray line broadening from filed aluminum and wolfram, Acta Metall. 1, 22-31, 1953.
8. Xu, S., and R.L. Merrill, Microstress and microcoercivity in multidomain grains, J. Geophys. Res. 94, 10627-10636, 1989.
9. Xu, S., and R.L. Merrill, Microcoercivity, bulk coercivily and saturation remanence in multidomain materials, J. Geophys. Res. 95, 7083-7090, 1990.
10. Xu, S., and R.L. Merrill, Stress, grain size and magnetic stability of magnetite, J. Geophys. Res. 97, 4321-4329, 1992.