Charge-exchange atoms and ion source divergence in a 20 tw applied-b ion diode

Physical Review Letters

Volumn 77, Issue 17, 1996, Pages 3557-3560

  Filuk, A B ^a   Bailey, J E ^a   Carlson, A L ^a   Johnson, D J ^a   Johnson, J ^a   Lake, P ^a   Mehlhorn, T A ^a   Mix, L P ^a   Renk, T J ^a   Stygar, W A ^a   Maron, Y ^b  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b WEIZMANN INSTITUTE OF SCIENCE   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; ATOMS; CURRENT DENSITY; DIODES; DOPPLER EFFECT; FIBER OPTICS; ION BEAMS; ION SOURCES; LITHIUM; LITHIUM COMPOUNDS; THIN FILMS;

ALKALI HALIDE FILMS; BEAM ANGULAR DIVERGENCE; ION DIODES; ION EMISSIONS; STARK SHIFT; ZEEMAN SHIFT;

ATOMIC SPECTROSCOPY;

EID: 0030264558     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.77.3557     Document Type: Article

References (26)

1. A. R. Moats et al., Rev. Sci. Instrum. 66, 743 (1995). RSINAK
2. M. S. Derzon et al., Phys. Rev. Lett. 76, 435 (1996). PRLTAO
3. S. Humphries, Jr., Nucl. Fusion 20, 1549 (1980). NUFUAU
4. D. J. Johnson et al., J. Appl. Phys. 53, 4579 (1982). JAPIAU
5. Y. Maron, M. D. Coleman, D. A. Hammer, and H. S. Peng, J. Appl. Phys. 61, 4781 (1987)
6. Y. Maron et al., Phys. Rev. A 39, 5842 (1989). PLRAAN
7. S. A. Slutz, Phys. Fluids B 4, 2645 (1992). PFBPEI
8. M. P. Desjarlais et al., Phys. Rev. Lett. 67, 3094 (1991). PRLTAO
9. S. A. Slutz et al., Phys. Plasmas 3, 2175 (1996). PHPAEN
10. C. L. Olson and J. W. Poukey, in Proceedings of the 9th International Conference on High Power Particle Beams, Washington, DC, 1992 (National Technical Information Service Report NTIS PB92-206168, Springfield, VA) p. 897.
11. T. A. Mehlhorn et al., Proceedings of the 10th International Conference on High Power Particle Beams, San Diego, CA, 1994 (National Technical Information Service Report NTIS PB95-144317, Springfield, VA) p. 53.
12. R. E. Olson et al., Proceedings of the 15th IEEE-NPSS Symposium on Fusion Engineering, Hyannis, MA, 1993 (IEEE Service Center, Piscataway, NJ, 1994), p. 189.
13. T. A. Green et al., Sandia National Laboratories Report No. SAND95-1794. Available from NTIS.
14. J. E. Bailey et al., Phys. Rev. Lett. 74, 1771 (1995). PRLTAO
15. J. A. Panitz, J. Vac. Sci. Technol. B 12, 2889 (1994)
16. P. R. Schwoebel and J. A. Panitz, J. Appl. Phys. 71, 2151 (1992). JAPIAU
17. J. Bailey, A. L. Carlson, R. L. Morrison, and Y. Maron, Rev. Sci. Instrum. 61, 3075 (1990).
18. J. E. Bailey, A. L. Carlson, and P. Lake, in Proceedings of the 1994 IEEE International Conference on Plasma Science, Santa Fe, 1994, IEEE Catalog No. 94CH3465-2, p. 133 (IEEE, Piscataway, NJ, 1994). RSINAK
19. R. L. Coldwell and G. J. Bamford, The Theory and Operation of Spectral Analysis Using Robfit (AIP, New York, 1991).
20. F. A Ilkov, J. E. Decker, and S. L. Chin, J. Phys. B 25, 4005 (1992). JPAPEH
21. M. E. Cuneo et al., in Proceedings of the 10th IEEE Pulsed Power Conference, Albuquerque, NM, 1995 (to be published).
22. D. R. Schultz (private communication).
23. J. Van Eck and J. Kistemaker, Physica (Utrecht) 26, 629 (1960). PHYSAG
24. A. P. Kalinin et al., Chem. Phys. 85, 341 (1984). CMPHC2
25. R. J. Leeper et al., Nucl. Instrum. Methods Phys. Res., Sect. B 40/41, 973 (1989). NIMBEU
26. A. B. Filuk et al., in Ref. p. 794.