Analysis of snubber-clamped diode-string mixed voltage interface ESD protection network for advanced microprocessors

Journal of Electrostatics

Volumn 38, Issue 1-2 SPEC. ISS., 1996, Pages 3-31

  Voldman, Steven H ^a   Gerosa, Gianfranco ^b   Gross, Vaughn P ^a   Dickson, Nicholas ^c   Furkay, Stephen ^a   Slinkman, James ^a  

^a IBM   (United States)

^b Somerset Design Center   (United States)

^c MOTOROLA INC   (United States)

Author keywords

Diode clamps; ESD; Mixed voltage; Protection

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER AIDED NETWORK ANALYSIS; COMPUTER SIMULATION; ELECTRIC DISCHARGES; ELECTROSTATICS; NETWORKS (CIRCUITS); SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DIODES; THERMOELECTRICITY;

DIODE CLAMPS; ELECTROSTATIC DISCHARGE (ESD) PROTECTION CIRCUITS; ELECTROTHERMAL SIMULATION; MIXED VOLTAGE INTERFACE MICROPROCESSORS; SHALLOW TRENCH ISOLATION;

MICROPROCESSOR CHIPS;

EID: 0030264354     PISSN: 03043886     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0304-3886(96)00014-9     Document Type: Article

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