Preparation and Raman study of B-doped Si microcrystals

Materials Science and Engineering: A

Volumn 217-218, Issue , 1996, Pages 155-158

  Kanzawa, Y ^a   Fujii, M ^a   Hayashi, S ^a   Yamamoto, K ^a  

^a KOBE UNIVERSITY   (Japan)

Author keywords

Microcrystals; Raman spectroscopy; Si

Indexed keywords

ABSORPTION SPECTROSCOPY; ATOMS; BORON; CRYSTAL MICROSTRUCTURE; CRYSTALS; ELECTRONS; INFRARED SPECTROSCOPY; PHONONS; RAMAN SPECTROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON EXCITATION; IR ABSORPTION SPECTRA; MICROCRYSTAL; PHONON SCATTERING; SURFACE PLASMON;

SEMICONDUCTING SILICON;

EID: 0030264139     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(96)10303-8     Document Type: Article

References (12)

1. R.N. Bhargava, D. Gallagher, X. Hong and A. Nurmikko, Phys. Rev. Lett., 72 (1994) 416.
2. H.M. Kim, S. Hayashi and K. Yamamoto, Jpn. J. Appl. Phys., 34 (1994) Suppl. 40.
3. M. Fujii, S. Hayashi and K. Yamamoto, Jpn. J. Appl. Phys., 30 (1991) 687.
4. M. Fujii, T. Nagareda, S. Hayashi and K. Yamamoto, Phys. Rev. B, 44 (1991) 6243.
5. C.T. Kirk, Phys, Rev. B, 38 (1988) 1255.
6. G. Hoffmann, A. Nagy and L. Puskas, J. Phys. D, 8 (1975) 1044.
7. F.S. Becker, D. Pawlik, H. Shafer and G. Staudigl, J. Vac. Sci. Technol. B, 4 (1986) 732.
8. F. Cerdeira, T.A. Fjeldly and M. Cardona, Solid State Commun., 13 (1973) 325.
9. F. Cerdeira, T.A. Fjeldly and M. Cardona, Phys. Rev. B, 8 (1973) 4734.
10. U. Fano, Rhys. Rev., 124 (1961) 1866.
11. U. Kreibig and L. Genzel, Surf. Sci., 156 (1985) 678.
12. J.I. Pankove, in A.F. Gibson and R.E. Burgers (eds.), Progress in Semiconductors, Vol. 9, Heywood, 1965, p. 67.