Far infrared attenuated total reflection spectroscopy for investigating superlattice phonon parameters

Journal of Physics Condensed Matter

Volumn 8, Issue 42, 1996, Pages 8027-8039

  Hamilton, A A ^a   Dumelow, T ^b   Parker, T J ^a   Smith, S R P ^a  

^a UNIVERSITY OF ESSEX   (United Kingdom)

^b FEDERAL UNIVERSITY OF RIO GRANDE DO NORTE   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFACES (MATERIALS); MATHEMATICAL MODELS; OPTICS; PHONONS; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR SUPERLATTICES; SURFACE ROUGHNESS;

FAR INFRARED ATTENUATED TOTAL REFLECTION SPECTROSCOPY; INTERFACE ROUGHNESS; LINEAR CHAIN MODEL; SUPERLATTICE PHONON PARAMETER;

INFRARED SPECTROSCOPY;

EID: 0030263807     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/8/42/021     Document Type: Article

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