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Volumn 28, Issue 4, 1996, Pages 451-459

Attributes control charts with large sample sizes

Author keywords

Attributes Control Charts; Sampling; Statistical Process Control; Statistical Quality Control

Indexed keywords

PROBABILITY; PROCESS ENGINEERING; SAMPLING; VARIATIONAL TECHNIQUES;

EID: 0030263387     PISSN: 00224065     EISSN: None     Source Type: Journal    
DOI: 10.1080/00224065.1996.11979703     Document Type: Article
Times cited : (25)

References (10)
  • 2
    • 5544259700 scopus 로고
    • Select Code 010-801-010. AT&T, Indianapolis, IN
    • AT&T (1988). SQC Troubleshooter User Manual, Select Code 010-801-010. AT&T, Indianapolis, IN.
    • (1988) SQC Troubleshooter User Manual
  • 5
    • 5544296995 scopus 로고
    • Private communication
    • HEBERT, M. (1992). Private communication.
    • (1992)
    • Hebert, M.1
  • 6
    • 0041972642 scopus 로고
    • All Count Distributions Are Not Alike
    • JACKSON, J. E. (1972). "All Count Distributions Are Not Alike". Journal of Quality Technology 4, pp. 86-92.
    • (1972) Journal of Quality Technology , vol.4 , pp. 86-92
    • Jackson, J.E.1
  • 9
    • 0016975557 scopus 로고
    • The Negative Binomial Model for Counts in Units of Varying Size
    • SHEAFFER, R. L. and LEAVENWORTH, R. S. (1976). "The Negative Binomial Model for Counts in Units of Varying Size". Journal of Quality Technology 8, pp. 158-163.
    • (1976) Journal of Quality Technology , vol.8 , pp. 158-163
    • Sheaffer, R.L.1    Leavenworth, R.S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.