Study of optical fibre structures by Atomic Force Microscopy

Optical and Quantum Electronics

Volumn 28, Issue 10, 1996, Pages 1563-1570

  Tsai, Din Ping ^a   Chung, Yueh Liang ^a  

^a NATIONAL CHUNG CHENG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

AMMONIUM COMPOUNDS; ANISOTROPY; ATOMIC FORCE MICROSCOPY; DOPING (ADDITIVES); ETCHING; GRADIENT INDEX OPTICS; LIGHT POLARIZATION; OPTICAL RESOLVING POWER; OXIDES; REFRACTIVE INDEX; STRUCTURE (COMPOSITION); THERMAL EFFECTS;

AMMONIUM BIFLUORIDE; SATURATED SOLUTION;

OPTICAL FIBERS;

EID: 0030263257     PISSN: 03068919     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF00326226     Document Type: Article

References (9)

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3. D SARID, Scanning Force Microscopy with Applications to Electric, Magnetic and Atomic Forces (Oxford University Press, New York, 1994).
4. H K WICKRAMASINGHE (ed.), Scanning Probe Microscopy (American Institute of Physics, New York, 1992) p. 1.
5. D. INNISS, Q ZHONG, A. M. VENGSARKAR, W. A. REED, S. G KOSINSKI and P L LEMAIRE, Appl. Phys. Lett. 65 (1994) 1528.
6. Prime Optical Fiber Corporation, SMF-1310, Science-Based Industrial Park, Hsiu Chu, 30077 Taiwan.
7. K. W RAINE, J. G. N. BAINES and D. E. PUTLAND, J. Lightwave Technol. 7 (1989) 1162.
8. M. KAWACHI, T EDAHIRO and H. TOBA, Electron. Lett. 18 (1982) 71.
9. H MURATA, Handbook of Optical Fibers and Cables (Marcel Dekker, New York, 1988) p. 19.