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Volumn 105, Issue 16, 1996, Pages 6688-6712

Two-photon resonance enhanced multiphoton ionization photoelectron spectroscopy of the SH (SD) radical below and above the lowest ionization threshold

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY LEVELS; ELECTROSTATICS; FREE RADICALS; PHOTOIONIZATION; PHOTONS; POLARIZATION; RESONANCE; SILICON COMPOUNDS;

EID: 0030263158     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.471850     Document Type: Article
Times cited : (14)

References (65)
  • 13
    • 84943890498 scopus 로고
    • 44, 265 (1981).
    • (1981) Mol. Phys. , vol.44 , pp. 265
  • 22
    • 0000860021 scopus 로고
    • and references therein
    • J. K. Park and H. Sun, Chem. Phys. Lett. 194, 485 (1992), and references therein.
    • (1992) Chem. Phys. Lett. , vol.194 , pp. 485
    • Park, J.K.1    Sun, H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.