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Volumn 157, Issue 2, 1996, Pages 303-309

Relaxation drag of dislocations in C60 crystals at low temperatures

Author keywords

[No Author keywords available]

Indexed keywords

DEGREES OF FREEDOM (MECHANICS); DISLOCATIONS (CRYSTALS); GLASS TRANSITION; HARDNESS; LOW TEMPERATURE EFFECTS; MOLECULAR STRUCTURE; STRESS RELAXATION;

EID: 0030262690     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssa.2211570212     Document Type: Article
Times cited : (8)

References (23)
  • 15
    • 85033844357 scopus 로고
    • The Electrochemical Society, Inc., May 21 to 26, Reno (NV)
    • R. S. RUOFF and A. M. STRZHEMECHNY, in: The Electrochemical Society, Inc., 187th Meeting Program, May 21 to 26, 1995, Reno (NV) (p. 180).
    • (1995) 187th Meeting Program , pp. 180
    • Ruoff, R.S.1    Strzhemechny, A.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.