Microstructure and phase characterization of diamond-like amorphous hydrogenated carbon films using STM/STS

Thin Solid Films

Volumn 287, Issue 1-2, 1996, Pages 36-44

  Rusman, I ^a   Klibanov, L ^a   Burstein, L ^a   Rosenberg, Yu ^a   Weinstein, V ^a   Ben Jacob, E ^a   Croitoru, N ^a   Seidman, A ^a  

^a TEL AVIV UNIVERSITY   (Israel)

Author keywords

Amorphous materials; Graphite; Hydrogen; Scanning tunnelling microscopy

Indexed keywords

CARRIER CONCENTRATION; CHEMICAL BONDS; CRYSTAL MICROSTRUCTURE; CURRENT VOLTAGE CHARACTERISTICS; ELECTRONIC PROPERTIES; FILM PREPARATION; GRAPHITE; HYDROGEN; NANOSTRUCTURED MATERIALS; PHASE COMPOSITION; SCANNING TUNNELING MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

AMORPHOUS HYDROGENATED CARBON FILMS; HIGH RESOLUTION MAP; INDIUM TIN OXIDE (ITO); PLASMA DECOMPOSITION;

AMORPHOUS FILMS;

EID: 0030262618     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)08757-3     Document Type: Article

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