Polarized common path optical heterodyne interferometer for measuring the elliptical birefringence of a quartz wave plate

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 35, Issue 10, 1996, Pages 5526-5529

  Chou, Chien ^a   Huang, Yeu Chuen ^b   Chang, Ming ^b  

^a NATIONAL YANG MING UNIVERSITY   (Taiwan)

^b CHUNG YUAN CHRISTIAN UNIVERSITY   (Taiwan)

Author keywords

Birefringence; Elliptical polarization; Heterodyne

Indexed keywords

EIGENSTATES; JONES MATRIX; OPTICAL HETERODYNE INTERFEROMETER; PHASE DIFFERENCE; PHASE LOCK IN TECHNIQUE;

BIREFRINGENCE; ELLIPSOMETRY; HETERODYNING; LIGHT POLARIZATION; MATRIX ALGEBRA; OPTICAL MATERIALS; OPTICAL VARIABLES MEASUREMENT; QUARTZ; SIGNAL DETECTION; SIGNAL TO NOISE RATIO;

INTERFEROMETERS;

EID: 0030262324     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.35.5526     Document Type: Article

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