Reliability and MTTFprediction of K-out-of-n complex systems with components subjected to multiple stages of degradation

International Journal of Systems Science

Volumn 27, Issue 10, 1996, Pages 995-1000

  Pham, Hoang ^a   Suprasad, A ^b   Misra, R B ^b  

^a DEPARTMENT OF INDUSTRIAL AND SYSTEMS ENGINEERING   (United States)

^b INDIAN INSTITUTE OF TECHNOLOGY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL CIRCUITS; DIGITAL DEVICES; DURABILITY; MATHEMATICAL MODELS; WEAR OF MATERIALS;

MEAN TIME TO FAILURE; MULTIPLE STAGES OF DEGRADATION;

RELIABILITY;

EID: 0030261885     PISSN: 00207721     EISSN: 14645319     Source Type: Journal    
DOI: 10.1080/00207729608929304     Document Type: Article

References (10)

1. Barlow, R. S., and Heidtmann, K. D., 1984, Computing fc-out-of-n system reliability. IEEE Transactions on Reliability, 33, 322-323.
2. Feller, W., 1968, An Introduction to Probability and its Applications Massachusetts, U.S.A. (New York: Wiley)
3. Kapur, K. C., and Lamberson, L. R., 1977, Reliability in Engineering Design (New York: Wiley).
4. Knuth, D. E., 1973, The Art of Computer Programming, Vol. 1: Fundamental Algorithms (Reading, Massachusetts, U.S.A.: Addison-Wesley).
5. Misra, K. B., 1992, Reliability Analysis and Prediction (Amsterdam: Elsevier).
6. Pham, H., 1992, On the optimal design of k-out-of-n: G subsystems. IEEE Transactions on Reliability, 41, 572-574.
7. Pham, H., and Upadhyaya, S. J., 1988, The efficiency of computing the reliability of k-oul-of-n systems, IEEE Transactions on Reliability, 37, 521-523.
8. Rushdi, A. M., 1993, Reliability of k-out-of-n systems. New Trends in System Reliability Evaluation, edited by K. B. Misra (Amsterdam: Elsevier), pp. 185-227.
9. Scheuer, E. M., 1988, Reliability of an m-out-of-n system when components failure induces higher failure in survivors. IEEE Transactions on Reliability, 37, 73-74.
10. Smotherman, M., Geist, R. M., and Trivedi, K. S., 1986, Proverbly conservative approximations to complex reliability models. IEEE Transactions on Computers, 35, 333-338.