Study of the silicon/γ-APS/pyralin assembly interfaces by X-ray photoelectron spectroscopy

Surface and Interface Analysis

Volumn 24, Issue 11, 1996, Pages 774-780

  George, I ^a   Viel, P ^b   Bureau, C ^b   Suski, J ^a   Lecayon G ^b  

^a SCHLUMBERGER   (United States)

^b CEA SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; MOLECULAR STRUCTURE; POLYAMIDES; SILICA; SILICON; SUBSTRATES; SURFACES; X RAY PHOTOELECTRON SPECTROSCOPY;

AMINOPROPYLTRIETHOXYSILANE; CORE ELECTRON BINDING; DENSITY FUNCTIONAL THEORY; PYRALIN ASSEMBLY;

INTERFACES (MATERIALS);

EID: 0030261538     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199610)24:11<774::AID-SIA180>3.0.CO;2-X     Document Type: Article

References (20)

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