Leakage current studies of thick a-Si:H detectors under high electric field conditions

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 380, Issue 1-2, 1996, Pages 18-22

  Ilie, A ^a,b   Equer, B ^b   Pochet, T ^a  

^a DEIN/SPE   (France)

^b LABORATOIRE DE PHYSIQUE DES INTERFACES ET DES COUCHES MINCES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; CHEMICAL VAPOR DEPOSITION; ELECTRIC CURRENT MEASUREMENT; ELECTRIC FIELDS; LEAKAGE CURRENTS; SEMICONDUCTOR DIODES; SPECTRUM ANALYSIS; VOLTAGE MEASUREMENT;

CURRENT VOLTAGE MEASUREMENTS; ELECTRON INJECTION; FIELD ENHANCED THERMAL GENERATION; NUCLEAR RADIATION DETECTION; SPECTRAL RESPONSE;

RADIATION DETECTORS;

EID: 0030261505     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(96)00291-4     Document Type: Article

References (15)

1. P. Roca i Cabarrocas, J.B. Chévrier, J. Huc, A. Lloret, J.Y. Parey and J.P.M. Schmitt, J. Vac. Sci. Technol. A 9 (1991) 2334.
2. P. Roca i Cabarrocas et al., J. Phys. I (France) 2 (1992) 1979.
3. P. Roca i Cabarrocas, Y. Boutiene and M.L. Theye, Phil. Mag. B 65 (1992) 1025.
4. T. Pochet, A. Ilie, F. Foulon and B. Equer, IEEE Trans. Nucl. Sci. NS-41 (1994) 4.
5. A. Ilie, T. Pochet and B. Equer, Proc. Materials Research Society, Amorphous Silicon Technology, 336 (1994) 121.
6. W.S. Hong, A. Mireshghi, J.S. Drewery, T. Jing, Y. Kitsuno, H. Lee, S.N. Kaplan and V. Perez-Mendez, IEEE Trans. Nucl. Sci. NS-42 (1995) 240.
7. B. Equer and A. Ilie, J. non-Cryst. Sol., ed. M. Silver, special volume (in press).
8. A. Ilie, B. Equer and T. Pochet, presented at the Material Research Society Spring Meeting, April 1995.
9. R.A. Street, Phil. Mag. B 63 (1991) 1343.
10. N. Kramer and C. van Berkel, Appl. Phys. Lett. 64 (1994) 1129.
11. A. Ilie and B. Equer, to be published.
12. J.B. Chevrier and B. Equer, J. Appl. Phys. 76 (1994) 7415.
13. J. Dubeau and T. Pochet, Nucl. Instr and Meth. B 54 (1991) 458.
14. G. Cho et al., IEEE Trans. Nucl. Sci. NS-40 (1992) 641.
15. V. Perez-Mendez, in: Physics and Applications of amorphous and microcristalline semiconductor devices, ed. J. Kanicki (Artech House Pub., Boston, 1991) p. 297.