Influences of ambient gases on the emission characteristics of nickel-deposited field emitters for vacuum microelectronics

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 35, Issue 10, 1996, Pages 5479-5484

  Nagao, Masayoshi ^a   Matsubara, Motoki ^a   Inoue, Kazunori ^a   Gotoh, Yasuhito ^a   Tsuji, Hiroshi ^a   Ishikawa, Junzo ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

Cold cathode; Emission stability; F N plot; Field emission; Flicker noise; Noise power; S K chart; Vacuum microelectronics

Indexed keywords

COLD CATHODE; ENERGY DISPERSIVE X RAY SPECTROSCOPY; FLICKER NOISE; FOWLER-NORDHEIM PLOT; MEASUREMENT CHAMBER; MICROEMITTERS; SEPPEN-KATAMUKI CHART; VACUUM CHAMBER; VACUUM MICROELECTRONICS;

DEPOSITION; ELECTRIC CURRENTS; ELECTRON EMISSION; MOLECULES; NICKEL; VACUUM APPLICATIONS; X RAY SPECTROSCOPY;

MICROELECTRONICS;

EID: 0030261074     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.35.5479     Document Type: Article

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