Measurement of glancing incidence-exit X-ray scattering in reflection high energy electron diffraction and total-reflection-angle X-ray spectroscopy system

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 35, Issue 10, 1996, Pages 5553-5557

  Liu, Ziyuan ^a,b   Ogota, Seiya ^a   Morishita, Tadataka ^a  

^a SUPERCONDUCTIVITY RESEARCH LABORATORY   (Japan)

^b INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

Author keywords

Deposited islands; Glancing incidence exit X ray scattering; RHEED TRAXS; Surface atomic layer

Indexed keywords

STRONTIUM TITANATE; SURFACE ATOMIC LAYER; TOTAL REFLECTION ANGLE X RAY SPECTROSCOPY SYSTEM; X RAY EMISSION; X RAY GENERATION SYSTEM; X RAY MEASUREMENT;

CRYSTAL STRUCTURE; LIGHT REFLECTION; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SINGLE CRYSTALS; STRONTIUM COMPOUNDS; X RAY SPECTROSCOPY; X RAYS;

X RAY DIFFRACTION;

EID: 0030261073     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.35.5553     Document Type: Article

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