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Volumn 233-237, Issue PART II, 1996, Pages 974-978

Displacement rate dependence of irradiation creep as predicted by the production bias model

Author keywords

[No Author keywords available]

Indexed keywords

CREEP; ELECTRON MICROSCOPY; HEAT SINKS; MATHEMATICAL MODELS; POINT DEFECTS; THERMAL EFFECTS;

EID: 0030261050     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3115(96)00310-8     Document Type: Article
Times cited : (3)

References (1)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.