Effect of PrBa2Cu3O7-x buffer layer thickness on the properties of YBa2Cu3O7-x thin films grown on sapphire by laser ablation

Journal of Superconductivity

Volumn 9, Issue 5, 1996, Pages 545-549

  Lee, Sang Yeol ^a   Park, Hyung Ho ^a  

^a Yonsei University   (South Korea)

Author keywords

Buffer layer thickness; Interdiffusion; Laser ablation; Sapphire substrate; Superconducting thin film

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; EXCIMER LASERS; FILM GROWTH; INTERDIFFUSION (SOLIDS); LASER ABLATION; MORPHOLOGY; OXIDE SUPERCONDUCTORS; PRASEODYMIUM COMPOUNDS; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; SUPERCONDUCTING TRANSITION TEMPERATURE; YTTRIUM COMPOUNDS;

SUPERCONDUCTING BUFFER LAYER;

SUPERCONDUCTING FILMS;

EID: 0030260956     PISSN: 08961107     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF00723529     Document Type: Article

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