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Volumn 380, Issue 3, 1996, Pages 613-617
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Electron and photon fields for dosimetric metrology generated by electron beams from a microtron
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
CALIBRATION;
ELECTRON BEAMS;
MEASUREMENTS;
MICROTRONS;
PHOTONS;
ELECTRON FIELDS;
DOSIMETRY;
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EID: 0030260583
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/0168-9002(96)00519-0 Document Type: Article |
Times cited : (13)
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References (6)
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