Continuous photoluminescence, time resolved photoluminescence and optically detected magnetic resonance measurements of PbI2 nanometer-sized particles, embedded in SiO2 films

Journal of Luminescence

Volumn 70, Issue 1-6 SPEC. ISS., 1996, Pages 421-434

  Lifshitz, E ^a   Yassen, M ^a   Bykov, L ^a   Dag, I ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

Magnetic resonance; PbI2nanoparticles; Photoluminescence; SiO2 films

Indexed keywords

CRYSTAL DEFECTS; EXCITONS; MAGNETIC RESONANCE MEASUREMENT; MAGNETIC RESONANCE SPECTROSCOPY; NANOSTRUCTURED MATERIALS; PHOTOLUMINESCENCE; SEMICONDUCTING LEAD COMPOUNDS; SILICA; SURFACES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

CONTINUOUS PHOTOLUMINESCENCE; DONOR ACCEPTOR RECOMBINATION EMISSION BANDS; EXCITON BOHR RADIUS; QUANTUM SIZE EFFECT; RADIATIVE DECAY PROCESSES; SIZE CONFINEMENT; SURFACE SITES; TIME RESOLVED PHOTOLUMINESCENCE;

SEMICONDUCTING FILMS;

EID: 0030260466     PISSN: 00222313     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-2313(96)00076-2     Document Type: Article

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