On linear dependencies in subspaces of LFSR-generated sequences

IEEE Transactions on Computers

Volumn 45, Issue 10, 1996, Pages 1212-1216

  Rajski, Janusz ^a,c   Tyszer, Jerzy ^b,c  

^a MENTOR GRAPHICS CORPORATION   (United States)

^b Franco Polish School of New Information and Communication Technologies   (Poland)

^c IEEE

Author keywords

Built in self test; Linear dependencies; Linear feedback shift registers; Primitive polynomials; Scan designs

Indexed keywords

APPROXIMATION THEORY; CALCULATIONS; COMPUTER SIMULATION; MONTE CARLO METHODS; POLYNOMIALS; PROBABILITY; VECTORS;

BUILT IN SELF TEST; LINEAR DEPENDENCY; LINEAR FEEDBACK SHIFT REGISTERS; SCAN DESIGN;

SHIFT REGISTERS;

EID: 0030260317     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/12.543715     Document Type: Article

References (9)

1. P.H. Bardell, "Design Considerations for Parallel Pseudorandom Pattern Generators," J. Electronic Testing, no. 1, pp. 73-87, 1990.
2. P.H. Bardell, "Calculating the Effects of Linear Dependencies in m-Sequences Used as Test Stimuli," IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems, vol. 11, ,no. 1, pp. 83-86, Jan. 1992.
3. P.H. Bardell, W.H. McAnney, and J. Savir, Built-in Test for VLSI: Pseudorandom Techniques. New York: Wiley-Interscience, 1987.
4. Z. Barzilai, D. Coppersmith, and A.L. Rosenberg, "Exhaustive Generation of Bit Patterns with Applications to VLSI Self-Testing," IEEE Trans. Computers, vol. 32, no. 2, pp. 190-194, Feb. 1983.
5. C.L. Chen, "Linear Dependencies in Linear Feedback Shift Registers," IEEE Trans. Computers, vol. 35, no. 12, pp. 1,086-1,088, Dec. 1986.
6. S. Hellebrand, J. Rajski, S. Tarnick, S. Venkataraman, and B. Courtois, "Built-in Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers," IEEE Trans. Computers, vol. 44, no. 2, pp. 223-233, Feb. 1995.
7. B. Koenemann, "LFSR-Coded Test Patterns for Scan Designs," Proc. European Test Conf., pp. 237-242, Munich, 1991.
8. J. Savir, and W.H. McAnney, "A Multiple Seed Linear Feedback Shift Register," IEEE Trans. Computers, vol. 41, no. 2, pp. 250-252, Feb. 1992.
9. L.-T. Wang, and E.J. McCluskey, "Hybrid Designs Generating Maximum-Length Sequences," IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems, vol. 7, no. 1, pp. 91-99, Jan. 1988.