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Volumn 167, Issue 3-4, 1996, Pages 596-606
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Structural defects in α-SiC single crystals grown by the modified-Lely method
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
CHARACTERIZATION;
CRYSTAL GROWTH;
CRYSTAL STRUCTURE;
SEMICONDUCTOR GROWTH;
SILICON CARBIDE;
SILICON WAFERS;
SINGLE CRYSTALS;
SURFACE STRUCTURE;
X RAY CRYSTALLOGRAPHY;
LANG METHOD;
MODIFIED LELY METHOD;
STRUCTURAL DEFECTS;
TRANSMISSION TOPOGRAPHS;
X RAY TOPOGRAPHY;
CRYSTAL DEFECTS;
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EID: 0030260225
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/0022-0248(96)00300-4 Document Type: Article |
Times cited : (98)
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References (18)
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