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Volumn 167, Issue 3-4, 1996, Pages 596-606

Structural defects in α-SiC single crystals grown by the modified-Lely method

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; CRYSTAL GROWTH; CRYSTAL STRUCTURE; SEMICONDUCTOR GROWTH; SILICON CARBIDE; SILICON WAFERS; SINGLE CRYSTALS; SURFACE STRUCTURE; X RAY CRYSTALLOGRAPHY;

EID: 0030260225     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-0248(96)00300-4     Document Type: Article
Times cited : (98)

References (18)
  • 13
    • 30244464968 scopus 로고    scopus 로고
    • English Patent 17911 (1892)
    • A.G. Acheson, English Patent 17911 (1892).
    • Acheson, A.G.1
  • 15
    • 84916464657 scopus 로고
    • University of South Carolina Press, Columbia, SC
    • H. Posen and J.A. Bruce, Silicon Carbide 1973 (University of South Carolina Press, Columbia, SC, 1974) p. 238.
    • (1973) Silicon Carbide , pp. 238
    • Posen, H.1    Bruce, J.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.