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Volumn 380, Issue 1-2, 1996, Pages 10-13
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Study of trapping levels in doped HgI2 radiation detectors
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Author keywords
[No Author keywords available]
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Indexed keywords
ALPHA PARTICLES;
BUTANE;
CHARGE CARRIERS;
CRYSTAL DEFECTS;
CRYSTAL IMPURITIES;
CRYSTAL LATTICES;
DEEP LEVEL TRANSIENT SPECTROSCOPY;
MERCURY COMPOUNDS;
NAPHTHALENE;
PARAFFINS;
POLYETHYLENE GLYCOLS;
POLYETHYLENES;
DETRAPPING PROCESS;
DOPANTS;
SOLID STATE MEASUREMENT;
TRANSIENT CHARGE TECHNIQUE;
TRAPPING LEVELS;
RADIATION DETECTORS;
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EID: 0030260142
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(96)00289-6 Document Type: Article |
Times cited : (16)
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References (28)
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