Structure analysis of amorphous Pd75Si25 alloy by electron diffraction and high-resolution electron microscopy

Materials Science and Engineering: A

Volumn 217-218, Issue , 1996, Pages 392-396

  Matsushita, Mitsuhide ^a   Hirotsu, Yoshihiko ^a   Ohkubo, Tadakatsu ^a   Oikawa, Tetsuo ^b   Makino, Akihiro ^c  

^a OSAKA UNIVERSITY   (Japan)

^b JEOL LTD   (Japan)

^c ALPS ELECTRIC CO LTD   (Japan)

Author keywords

Amorphous Pd75Si25; HREM

Indexed keywords

AMORPHOUS ALLOYS; ATOMS; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; MORPHOLOGY; NANOSTRUCTURED MATERIALS; SPUTTER DEPOSITION; THIN FILMS;

IMAGING PLATE; MEDIUM RANGE ORDER; NANO PROBE ELECTRON DIFFRACTION; PAIR DISTRIBUTION FUNCTION;

PALLADIUM COMPOUNDS;

EID: 0030259984     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(96)10343-9     Document Type: Article

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