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Volumn 287, Issue 1-2, 1996, Pages 266-270
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Cu films deposited by a partially ionized beam (PIB)
a a a a |
Author keywords
Adhesion; Copper; Deposition process; Resistivity
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Indexed keywords
ADHESION;
ANNEALING;
CHEMICAL VAPOR DEPOSITION;
COPPER;
CURRENT DENSITY;
ELECTRIC CONDUCTIVITY OF SOLIDS;
ION BEAMS;
IONIZATION OF SOLIDS;
SILICA;
SUBSTRATES;
THIN FILMS;
X RAY DIFFRACTION ANALYSIS;
ACCELERATION VOLTAGES;
COPPER THIN FILMS;
ELECTRON EMISSION CURRENT;
ION BEAM CURRENT DENSITY;
PARTIALLY IONIZED BEAM (PIB);
SILICON SUBSTRATES;
METALLIC FILMS;
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EID: 0030259981
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(96)08739-1 Document Type: Article |
Times cited : (7)
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References (18)
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