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Volumn 287, Issue 1-2, 1996, Pages 266-270

Cu films deposited by a partially ionized beam (PIB)

Author keywords

Adhesion; Copper; Deposition process; Resistivity

Indexed keywords

ADHESION; ANNEALING; CHEMICAL VAPOR DEPOSITION; COPPER; CURRENT DENSITY; ELECTRIC CONDUCTIVITY OF SOLIDS; ION BEAMS; IONIZATION OF SOLIDS; SILICA; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 0030259981     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)08739-1     Document Type: Article
Times cited : (7)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.