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Physica C: Superconductivity and its Applications

Volumn 270, Issue 1-2, 1996, Pages 91-96

Critical current, film thickness and grain alignment for spray-pyrolyzed films of TlBa2Ca2Cu3Ox

(7) Specht, E D a Goyal, A a Kroeger, D M a Mogro Campero, A b Bednarczyk, P J b Tkaczyk, J E b DeLuca, J A b

a OAK RIDGE NATIONAL LABORATORY (United States)

b GE GLOBAL RESEARCH (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTAL MICROSTRUCTURE; DEPOSITION; FILM GROWTH; GRAIN BOUNDARIES; HIGH TEMPERATURE SUPERCONDUCTORS; OXIDE SUPERCONDUCTORS; PULSED LASER APPLICATIONS; X RAY DIFFRACTION;

FILM THICKNESS; GRAIN ALIGNMENT; SPRAY PYROLYZED FILMS;

SUPERCONDUCTING FILMS;

EID: 0030259103 PISSN: 09214534 EISSN: None Source Type: Journal
DOI: 10.1016/0921-4534(96)00492-3 Document Type: Article

Times cited : (9)

References (14)

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