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Volumn 366, Issue 2, 1996, Pages 353-359

Predicted carbon-cluster field evaporation from graphite by pulsed-field STM

Author keywords

Carbon clusters; Field evaporation; Graphite; Scanning tunneling microscopy

Indexed keywords

ATOMS; ELECTRIC FIELDS; EVAPORATION; GRAPHITE; MATHEMATICAL MODELS; SCANNING TUNNELING MICROSCOPY;

EID: 0030257433     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(96)00587-0     Document Type: Article
Times cited : (2)

References (24)
  • 10
    • 0003662668 scopus 로고
    • Cambridge University Press, Cambridge
    • E.W. Müller and T.T. Tsong, Field Ion Microscopy, Principles and Applications (Elsevier, New York, 1969); T.T. Tsong, Atom-Probe Field Ion Microscopy (Cambridge University Press, Cambridge, 1990).
    • (1990) Atom-Probe Field Ion Microscopy
    • Tsong, T.T.1
  • 14
    • 0001402503 scopus 로고
    • N.D. Lang, Phys. Rev. B 45 (1992) 13599; 49 (1994) 2067.
    • (1992) Phys. Rev. B , vol.45 , pp. 13599
    • Lang, N.D.1
  • 15
    • 24444436292 scopus 로고
    • N.D. Lang, Phys. Rev. B 45 (1992) 13599; 49 (1994) 2067.
    • (1994) Phys. Rev. B , vol.49 , pp. 2067


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.