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Volumn 19, Issue 4, 1996, Pages 270-276

FCOB reliability evaluation simulating multiple rework/reflow processes

Author keywords

[No Author keywords available]

Indexed keywords

ADHESIVE JOINTS; ELECTRIC RESISTANCE; ELECTRONICS PACKAGING; FLIP CHIP DEVICES; MICROSTRUCTURE; MULTICHIP MODULES; PLASTIC ADHESIVES; PRINTED CIRCUIT BOARDS; PRINTED CIRCUIT MANUFACTURE; RELIABILITY; THERMAL CYCLING; THERMAL STRESS;

EID: 0030257357     PISSN: 10834400     EISSN: None     Source Type: Journal    
DOI: 10.1109/3476.558554     Document Type: Article
Times cited : (2)

References (0)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.