|
Volumn 65, Issue 1-2, 1996, Pages 31-44
|
A set of computer programs for determining defocus and astigmatism in electron images
|
Author keywords
[No Author keywords available]
|
Indexed keywords
COMPUTER SIMULATION;
COMPUTER SOFTWARE;
ELECTRON MICROSCOPES;
FOURIER TRANSFORMS;
LEAST SQUARES APPROXIMATIONS;
OPTICAL TRANSFER FUNCTION;
ASTIGMATISM;
CONTRAST TRANSFER FUNCTION;
MEAN DEFOCUS;
SOFTWARE PACKAGE CTFFIT;
SOFTWARE PACKAGE PCTFREFN;
SOFTWARE PACKAGE PLTCTFX;
SOFTWARE PACKAGE SCTRAVGFT;
ELECTRON MICROSCOPY;
ARTICLE;
ASTIGMATISM;
COMPUTER PROGRAM;
ELECTRON MICROSCOPY;
|
EID: 0030250308
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/S0304-3991(96)00052-6 Document Type: Article |
Times cited : (43)
|
References (20)
|