Nonlinear, eddy current damped, thin-film write head model

IEEE Transactions on Magnetics

Volumn 32, Issue 5 PART 1, 1996, Pages 3524-3526

  Klaaasen, Klaas B ^a   Hirko, Richard G ^a  

^a IBM ALMADEN RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DAMPING; EDDY CURRENTS; ELECTRIC FREQUENCY MEASUREMENT; ELECTRIC IMPEDANCE MEASUREMENT; ELECTRIC NETWORK ANALYSIS; MAGNETIC FILM STORAGE; MAGNETIC THIN FILMS; MAGNETIZATION; MATHEMATICAL MODELS; NONLINEAR SYSTEMS;

EDDY CURRENT DAMPING; ELECTRICAL INPUT PORT; MAGNETIC OUTPUT PORT; WRITE HEAD MODEL;

MAGNETIC HEADS;

EID: 0030247951     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.538678     Document Type: Article

References (6)

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3. E.P. Valstyn and H. Huang, "An extended, dynamic transmission line model for thin-film heads," IEEE Trans. Magn. 029, pp. 3870-0872, 1993.
4. J. Zhu and P. Thayamballi, "Frequency losses of readback efficiency for thin-film inductive heads," IEEE Trans. Magn., 032, pp. 84-89, 1996.
5. R. Wood, M. Williams, and J. Hong, 'Considerations for high data rate recording with thin-film heads." IEEE Trans. Magn. 026, pp. 2954-2959, 1990.
6. K.B. Klaassen and J.C.L. van Peppen, 'Yoke flux reversal time in thin-film write heads," IEEE Trans. Magn., 031, pp. 26572659, 1995.