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Volumn 15, Issue 18, 1996, Pages 1636-1637

Study of layer disorder and microstructural parameters of molybdenum-tungsten mixed sulpho-selenide Mo0.5W0.5SxSe2-x (0 ≤ x ≤ 2) by X-ray line profile analysis

(4) Palit, D a Srivastava, S K a Chakravorti, M C a Samantaray, B K a

a INDIAN INSTITUTE OF TECHNOLOGY (India)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTOMETERS; ELECTRONIC STRUCTURE; MICROSTRUCTURE; PARTICLE SIZE ANALYSIS; SELENIUM COMPOUNDS; SULFUR COMPOUNDS; SYNTHESIS (CHEMICAL); X RAY ANALYSIS; X RAY DIFFRACTION;

METHOD OF VARIANCE; SELENIDES; SULPHIDES; X RAY LINE PROFILE ANALYSIS;

MOLYBDENUM ALLOYS;

EID: 0030247474 PISSN: 02618028 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (5)

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