Transitional gate delay detection for combinational circuits using a genetic algorithm

Electronics Letters

Volumn 32, Issue 19, 1996, Pages 1748-1749

  O'Dare, M J ^a   Arslan, T ^a  

^a CARDIFF UNIVERSITY   (United Kingdom)

Author keywords

Combinational circuits; Genetic algorithms

Indexed keywords

COMPUTER SIMULATION; DIGITAL INTEGRATED CIRCUITS; ERROR DETECTION; FAILURE ANALYSIS; GENETIC ALGORITHMS; INTEGRATED CIRCUIT TESTING; LOGIC GATES; MATHEMATICAL MODELS;

DIGITAL LOGIC CIRCUITS; FAULT COVERAGE; GLOBAL RECORD TABLE; STUCK AT FAULTS; TEST VECTOR PAIRS; TRANSITIONAL GATE DELAY DETECTION;

COMBINATORIAL CIRCUITS;

EID: 0030247450     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19961184     Document Type: Article

References (9)

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