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Applied Physics A: Materials Science and Processing

Volumn 63, Issue 3, 1996, Pages 207-216

Fluorescence interference-contrast microscopy on oxidized silicon using a monomolecular dye layer

(2) Lambacher, Armin a Fromherz, Peter a

a MAX PLANCK INSTITUTE OF BIOCHEMISTRY (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DYES; ELECTRIC FIELDS; LANGMUIR BLODGETT FILMS; LIGHT INTERFERENCE; LIGHT REFLECTION; LIGHT REFRACTION; MEMBRANES; OPTICAL MICROSCOPY; REFRACTIVE INDEX; SILICA; SURFACE PROPERTIES;

FLUORESCENCE INTERFERENCE CONTRAST MICROSCOPY; MONOMOLECULAR DYE LAYER; NEURON SILICON JUNCTIONS; SILICON CHIP; SURFACE PROFILE;

FLUORESCENCE;

EID: 0030247064 PISSN: 09478396 EISSN: None Source Type: Journal
DOI: 10.1007/BF01567871 Document Type: Article

Times cited : (188)

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