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Volumn 117, Issue 3, 1996, Pages 289-294

Growth mode of Au layer on Si(001)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMS; CRYSTAL ORIENTATION; FILM GROWTH; SCANNING ELECTRON MICROSCOPY; SILICON; SPECTROSCOPY; THIN FILMS; THREE DIMENSIONAL;

EID: 0030247061     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(96)00292-3     Document Type: Article
Times cited : (7)

References (22)
  • 9
    • 30244431718 scopus 로고
    • Eds. A.W. Czandera and David M. Hercules Plenum, New York
    • E. Taglauer, in: Ion Spectroscopies for Surface Analysis, Eds. A.W. Czandera and David M. Hercules (Plenum, New York, 1991) p. 394.
    • (1991) Ion Spectroscopies for Surface Analysis , pp. 394
    • Taglauer, E.1
  • 17
    • 0004265663 scopus 로고
    • Elsevier, Amsterdam
    • A. Roth, Vacuum Technology (Elsevier, Amsterdam, 1991) p. 157.
    • (1991) Vacuum Technology , pp. 157
    • Roth, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.