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Applied Physics Letters

Volumn 69, Issue 12, 1996, Pages 1798-1800

The structural symmetry of epitaxial Tl2Ba2CuO6+δ thin films

(3) Ren, Z F a Wang, J H a Miller, D J b

a UNIVERSITY AT BUFFALO (United States)

b ARGONNE NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; MAGNETRON SPUTTERING; PHASE TRANSITIONS; SINGLE CRYSTALS; STRONTIUM COMPOUNDS; SUPERCONDUCTING FILMS; SUPERCONDUCTING TRANSITION TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

BRIGHT FIELD IMAGING; CONVERGENT BEAM ELECTRON DIFFRACTION; ELECTRON PAIRING SYMMETRY; SELECTED AREA ELECTRON DIFFRACTION; STRONTIUM TITANATE; THALLIUM BARIUM CUPRATE;

THALLIUM COMPOUNDS;

EID: 0030247036 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.117490 Document Type: Article

Times cited : (16)

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