Sputtered NiFeZr as a soft biasing layer in MR head

IEEE Transactions on Magnetics

Volumn 32, Issue 5 PART 2, 1996, Pages 4526-4528

  Choukh, Alexandre M ^a  

^a Samsung Advanced Institute of Technology (SAIT)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; COERCIVE FORCE; ELECTRIC CONDUCTIVITY; MAGNETIC ANISOTROPY; MAGNETIC HEADS; MAGNETIC VARIABLES MEASUREMENT; MAGNETORESISTANCE; MAGNETOSTRICTION; NICKEL ALLOYS; SPUTTERING; THICKNESS MEASUREMENT; X RAY DIFFRACTION;

MAGNETORESISTANCE RATIO; MAGNETORESISTIVE HEAD; NICKEL IRON ZIRCONIUM ALLOYS; SATURATION INDUCTION; SOFT BIASING LAYER;

MAGNETIC FILMS;

EID: 0030246721     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.538919     Document Type: Article

References (9)

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6. K. Yamada, T. Maruyama, M. Ohmukai, T. Tatsumi, and H. Urai, "CoZrMo amorphous films as a soft adjacent layer for biasing magnetoresistive elements with a current shunt layer", J. Appl. Phys., vol. 63, pp. 4023-4025, 1988.
7. M.-M. Chen, N. Gharsallah, G. L. Gorman, and J. Latimer, "Ternary NiFeX as soft biasing film in a magnetoresistive sensor", J. Appl. Phys., vol. 69, pp. 5631-5633, 1991.
8. M. T. Krounbi, O. Voegeli, "Magnetoresistive read transducer", US Parent No. 4,713,708, Dec. 15, 1987.
9. R. Nishioka, K. Mitsuoka, H. Fukui, S. Narishige, and M. Fuyama, "Magnetic and electrical properties of NiFe-oxide mixture films", IEEE Trans. Magn., vol. 31, pp. 2633-2635, 1995.