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Volumn 32, Issue 5 PART 1, 1996, Pages 3819-3821
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Crystallographic and recording characteristics of post-annealed ba-ferrite sputtered films
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
COERCIVE FORCE;
CRYSTALLIZATION;
CRYSTALLOGRAPHY;
FERRITES;
FILM PREPARATION;
MAGNETIC HEADS;
MAGNETIC PROPERTIES;
MAGNETIC RECORDING;
SPUTTER DEPOSITION;
X RAY DIFFRACTION ANALYSIS;
BARIUM FERRITE FILMS;
ELECTRON PROBE MICROANALYSIS;
FACING TARGETS SPUTTERING;
RECORDING DENSITY;
MAGNETIC THIN FILMS;
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EID: 0030246675
PISSN: 00189464
EISSN: None
Source Type: Journal
DOI: 10.1109/20.539183 Document Type: Article |
Times cited : (9)
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References (7)
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