Defect images by planar ect probe of meander-mesh coils

IEEE Transactions on Magnetics

Volumn 32, Issue 5 PART 2, 1996, Pages 4956-4958

  Yamada, Sotoshi ^a   Katou, Masaki ^a   Iwahara, Masayoshi ^a   Dawson, Francis P ^b  

^a KANAZAWA UNIVERSITY   (Japan)

^b UNIVERSITY OF TORONTO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CRACKS; DEFECTS; EDDY CURRENT TESTING; ELECTRIC CURRENT DISTRIBUTION; FABRICATION; IMAGE ANALYSIS; IMAGING TECHNIQUES; MAGNETIC FIELDS; NICKEL ALLOYS;

IMAGE DATA; MEANDER MESH COILS; PLANAR COIL; TWO DIMENSIONAL;

ELECTRIC COILS;

EID: 0030246647     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.539300     Document Type: Article

References (1)

1. S.Yamada, M.Katou, M.Iwahara, and F.Dawson, "Eddy-current testing probe composed of planar coils", IEEE Transaction on Magnetics, vol.31, no.6, 1995, pp.3185-3187.