High frequency characterization and recording performance of nife and laminated fen heads (ben)

IEEE Transactions on Magnetics

Volumn 32, Issue 5 PART 1, 1996, Pages 3530-3532

  Hu, H L ^a   Weresin, Walt E ^a   Home, D ^a   Gallagher, T ^a   Robertson, N ^a   Re, M ^a  

^a IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; DEGRADATION; EDDY CURRENTS; FREQUENCIES; IRON ALLOYS; MAGNETIC DISK STORAGE; MAGNETIC FIELDS; MAGNETIC RECORDING; MAGNETIC VARIABLES MEASUREMENT; NICKEL ALLOYS; PERFORMANCE;

HIGH FREQUENCY CHARACTERIZATION; IRON NITRIDE; NICKEL IRON; NONLINEAR WRITE EFFECTS; OVERWRITE RECORDING MEASUREMENTS; WRITE FIELD DEGRADATION;

MAGNETIC HEADS;

EID: 0030246475     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.538680     Document Type: Article

References (5)

1. H.Takano et al, "High-Frequncy Write Characterization of Thin Film Heads for HDDs", IEEE Trans. Mag. vol. 031, pp 2651-56, Nov. 1995.
2. Klaas B. Klaassen and Richard G. Hirko, "Writing and Reading at High Data Rates", IEEE Trans. Mag. vol. 032, pp 90-96, Jan 1996.
3. P. Thayamballi, "Modeling the Effect of Write Field Rise Time on the Recording Properties in Thin Film Media", IEEE Trans. Mag. vol 032, pp 61-66, Jan. 1996.
4. H. L. Hu et al, "Writing Performance of Narrow Gap Heads Made with Sputtered Laminated FeN Materials on 03800 Oe Coercivity Media", IEEE Trans. Mag. vol 30, pp 3870-72, Nov. 1994.
5. G. Tranopolsk, L. Tran, A. Barany, H. Bertram, "DC Modulation Noise and Demagnetizing Fields in Thin Metallic Media", IEEE Trans. Mag. vol 025, pp 3160-5, July 1989.