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Volumn 11, Issue 9, 1996, Pages 1339-1345
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Remote-impurity scattering in AllnAs/GalnAs FETs
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRON TRANSPORT PROPERTIES;
FIELD EFFECT TRANSISTORS;
IMPURITIES;
INTERFACES (MATERIALS);
MATHEMATICAL MODELS;
PHONONS;
SEMICONDUCTING ALUMINUM COMPOUNDS;
SEMICONDUCTING GALLIUM COMPOUNDS;
SEMICONDUCTING INDIUM COMPOUNDS;
STATISTICAL METHODS;
SURFACE ROUGHNESS;
ALLOY SCATTERING;
DIPOLE LIKE FLUCTUATIONS;
DIPOLE MODEL;
HALL MOBILITY;
INTERFACE ROUGHNESS SCATTERING;
POLAR OPTICAL PHONON;
REMOTE IMPURITY SCATTERING;
STATISTICAL SCREENING MODEL;
SEMICONDUCTOR DEVICE STRUCTURES;
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EID: 0030246401
PISSN: 02681242
EISSN: None
Source Type: Journal
DOI: 10.1088/0268-1242/11/9/016 Document Type: Article |
Times cited : (5)
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References (19)
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