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Volumn 11, Issue 9, 1996, Pages 1339-1345

Remote-impurity scattering in AllnAs/GalnAs FETs

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TRANSPORT PROPERTIES; FIELD EFFECT TRANSISTORS; IMPURITIES; INTERFACES (MATERIALS); MATHEMATICAL MODELS; PHONONS; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTING INDIUM COMPOUNDS; STATISTICAL METHODS; SURFACE ROUGHNESS;

EID: 0030246401     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/11/9/016     Document Type: Article
Times cited : (5)

References (19)
  • 10
    • 5844419870 scopus 로고
    • PhD Thesis School of Electrical Engineering Cornell University
    • Foisy M 1990 PhD Thesis School of Electrical Engineering Cornell University
    • (1990)
    • Foisy, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.