XPS study of Mn thin films grown on GaAs(001) surfaces

Surface and Interface Analysis

Volumn 24, Issue 9, 1996, Pages 653-656

  Dong, G S ^a   Xu, M ^a   Chen, Y ^a   Jin, X F ^a   Wang, Xun ^a  

^a FUDAN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL REACTIONS; COMPOSITION; DIFFUSION; FILM GROWTH; MANGANESE; SEMICONDUCTING GALLIUM ARSENIDE; SUBSTRATES; SURFACES; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

COMPOSITION DEPTH PROFILE; INTERDIFFUSION;

SURFACE STRUCTURE;

EID: 0030246254     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1096-9918(19960916)24:9<653::aid-sia146>3.0.co;2-8     Document Type: Article

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