Design of a Michelson interferometer for the measurement of electrostrictive strains

Optics and Laser Technology

Volumn 28, Issue 6, 1996, Pages 481-484

  Kloos, G ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Double face detection; Interferometers; Michelson interferometer; Null method; Quadratic electrostriction; Small strain measurement

Indexed keywords

ELECTRIC FIELD EFFECTS; ELECTROOPTICAL EFFECTS; ELECTROSTRICTION; FABRY-PEROT INTERFEROMETERS; OPTIMIZATION; PERFORMANCE; STRAIN MEASUREMENT;

BACK FACE MOTION; COMPENSATION METHOD; DISPLACEMENTS; DOUBLE FACE DETECTION; ELECTROSTRICTIVE STRAINS; MICHELSON INTERFEROMETER; NON FERROELECTRIC MATERIALS; NULL METHOD; QUADRATIC ELECTROSTRICTION;

INTERFEROMETERS;

EID: 0030245892     PISSN: 00303992     EISSN: None     Source Type: Journal    
DOI: 10.1016/0030-3992(96)00007-2     Document Type: Article

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