Structural characterization of Pd-doped SnO2 thin films using XPS

Surface and Interface Analysis

Volumn 24, Issue 9, 1996, Pages 662-666

  Cao, Xiaoping ^a   Cao, Lili ^a   Yao, Wenqing ^a   Ye, Xiaoyan ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFERENTIAL THERMAL ANALYSIS; ELECTRON ENERGY LEVELS; FERMI LEVEL; FILM PREPARATION; HEAT TREATMENT; PALLADIUM; SEMICONDUCTING TIN COMPOUNDS; SOL-GELS; THERMOGRAVIMETRIC ANALYSIS; THIN FILMS; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

CHEMICAL STATES; SCANNING AUGER MICROSCOPY; STRUCTURAL CHARACTERIZATION; TIN OXIDE;

SURFACE STRUCTURE;

EID: 0030245835     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(19960916)24:9<662::AID-SIA155>3.0.CO;2-C     Document Type: Article

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