Nanoscale magnetic mounds fabricated using a scanning probe microscope

IEEE Transactions on Magnetics

Volumn 32, Issue 5 PART 2, 1996, Pages 4443-4447

  Bessho, K ^a   Iwasaki, Y ^a   Hashimoto, S ^a  

^a SONY CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEPOSITION; FABRICATION; MAGNETIC MATERIALS; MAGNETIC PROPERTIES; MAGNETISM; MAGNETIZATION; PROBES; SCANNING TUNNELING MICROSCOPY;

MAGNETIC FORCE MICROSCOPY; MAGNETIC INTERACTION; MAGNETIC STRUCTURE; NANOSCALE MAGNETIC MOUNDS; SCANNING PROBE MICROSCOPE;

NANOSTRUCTURED MATERIALS;

EID: 0030245417     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.538895     Document Type: Article

References (14)

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